The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 04, 2012
Filed:
Jan. 15, 2009
Herman Aranguren, Tucson, AZ (US);
David Bruce Legendre, Tucson, AZ (US);
David Charles Reed, Tucson, AZ (US);
Max Douglas Smith, Tucson, AZ (US);
Herman Aranguren, Tucson, AZ (US);
David Bruce LeGendre, Tucson, AZ (US);
David Charles Reed, Tucson, AZ (US);
Max Douglas Smith, Tucson, AZ (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method, system, and computer program product for identifying an overlay of a data processing target structure in a computing environment is provided. At least one of examining a mapping macro for the target structure with a set of valid ranges, comparing the set of valid ranges with the target structure to identify a string of at least one first invalid value and a last invalid value and locate invalid regions of the target structure, and examining executable code associated with the target structure, comparing at least one unchanged module against at least one additional module exhibiting an overlay characteristic to identify the string of the at least one first invalid value and the last invalid value and locate invalid regions of the target structure, is performed.