The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 04, 2012
Filed:
Jul. 16, 2008
Identifying an optimized test bit pattern for analyzing electrical communications channel topologies
Moises Cases, Austin, TX (US);
Bhyrav M. Mutnury, Austin, TX (US);
Navraj Singh, Brandon, MS (US);
Caleb J. Wesley, Winston Salem, NC (US);
Moises Cases, Austin, TX (US);
Bhyrav M. Mutnury, Austin, TX (US);
Navraj Singh, Brandon, MS (US);
Caleb J. Wesley, Winston Salem, NC (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Identifying an optimized test bit pattern for analyzing electrical communications channel topologies, including: ranking according to channel quality, from worst to best, a set of channel topologies for an electrical communications channel; and for each ranked channel topology beginning with the worst, carrying out the following steps in an iterative loop until a concatenated test bit pattern and a previously optimized test bit pattern are functionally equally fit: concatenating to a previously optimized test bit pattern an additional test bit pattern; optimizing the concatenated test bit pattern values for a next ranked channel in the subset, leaving the optimized values of the previously optimized test bit pattern unchanged; and comparing through use of a fitness function the relative qualities of the previously optimized test bit pattern and the optimized concatenated test bit pattern.