The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 04, 2012

Filed:

Feb. 05, 2010
Applicants:

Sunil Bharadwaj, Beaverton, OR (US);

Stephen A. Byrd, San Jose, CA (US);

David L. Merbach, Rochester, MN (US);

Kevin J. Webster, Lake Worth, FL (US);

LI Zhou, San Jose, CA (US);

Inventors:

Sunil Bharadwaj, Beaverton, OR (US);

Stephen A. Byrd, San Jose, CA (US);

David L. Merbach, Rochester, MN (US);

Kevin J. Webster, Lake Worth, FL (US);

Li Zhou, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/173 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present disclosure provides techniques for updating fabric alert definitions defined for a fiber channel or other fabric-based network within a storage management system. One embodiment provides techniques for detecting fabric merges, fabric segmentations, and principal switch changes of the fabric and modifying fabric alert definitions as a result of these changes. Thus, any alert definitions scoped by fabric will remain relevant even after fabric structural changes, and duplicate and/or redundant alerts may be reduced within the storage management system. In a further embodiment, detection of fabric changes is performed by first storing relationships between fabrics and switches, and comparing the current relationships between the fabrics and the switches against the stored relationships. Upon recognition of changes within the fabrics, the fabric alert definitions may be automatically analyzed and updated.


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