The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 04, 2012

Filed:

Jun. 29, 2001
Applicants:

Guerry L. Grune, Virginia Beach, VA (US);

Douglas R. Plante, Virginia Beach, VA (US);

Yuen Sun Tsang, Virginia Beach, VA (US);

Inventors:

Guerry L. Grune, Virginia Beach, VA (US);

Douglas R. Plante, Virginia Beach, VA (US);

Yuen Sun Tsang, Virginia Beach, VA (US);

Assignee:

Other;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system, method, and computer-based logic flow for a web-enabled tool that allows simultaneous intelligent searching, knowledge management based problem solving, valuation, and modeling of intellectual property and scientific information are described herein. The system accesses databases of intellectual property and scientific information. Additionally, the computer-based logic flow utilizes valuation techniques based on the Black-Sholes Options Pricing model or discounted cash flow methods. The system receives user queries and simultaneously accesses intellectual property, scientific information, knowledge management based problem solving and valuation based algorithm databases. Pertinent information is then categorized, analyzed, disseminated and displayed. The system simultaneously displays intellectual property and valuation information in one model as well as non-intellectual property protected scientific information. Content, value, and direction of current and future specific technology trends can be easily, quickly and accurately accessed based on review of the models and displays associated with that specific technology.


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