The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 04, 2012

Filed:

Jan. 23, 2009
Applicants:

Amitanand Aiyer, Austin, TX (US);

Eric A. Anderson, Palo Alto, CA (US);

Xiaozhou LI, Cupertino, CA (US);

Mehul A. Shah, Saratoga, CA (US);

John Johnson Wylie, San Francisco, CA (US);

Inventors:

Amitanand Aiyer, Austin, TX (US);

Eric A. Anderson, Palo Alto, CA (US);

Xiaozhou Li, Cupertino, CA (US);

Mehul A. Shah, Saratoga, CA (US);

John Johnson Wylie, San Francisco, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for measuring consistability of a distributed storage system is disclosed. The method includes determining at least one consistency level that the distributed storage system can provide. A plurality of failure classes can be determined for the distributed storage system. A probability of the distributed storage system to be in each of the plurality of failure classes can be measured. Each failure class can be mapped to the at least one consistency level. The probability of each failure class for each consistency level can be summed to determine an expected portion of time that the distributed storage system provides each consistency level.


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