The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 04, 2012

Filed:

Sep. 10, 2009
Applicant:

Takahiro Masumura, Tucson, AZ (US);

Inventor:

Takahiro Masumura, Tucson, AZ (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06M 7/02 (2006.01); G06M 7/08 (2006.01); G01N 30/16 (2006.01); G01N 30/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

A measurement apparatus includes an elastic detector configured to detect an elastic wave by utilizing photoacoustic tomography and to convert the elastic wave into a detection signal, and a signal processor configured to calculate an absorption characteristic of a heterogeneous part included in a homogeneous part of a scattering medium based on μ=2P(z)/(ΓΦ(z)) where μis the absorption coefficient at distance z from the light source, P(z) is the pressure of the elastic wave at distance z, Γ is a Grüneisen coefficient, and Φ(z) is the light intensity at the position of the heterogeneous part, the signal processor obtaining the light intensity by approximating a signal component derived from the homogeneous part separated from a signal component derived from the heterogeneous part in the scattering medium by utilizing the detection signal output from the elastic wave detector.


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