The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 04, 2012

Filed:

Nov. 26, 2004
Applicants:

Haishan Zeng, Vancouver, CA;

Harvey Lui, Singapore, SG;

Zhiwei Huang, Singapore, SG;

David I. Mclean, Vancouver, CA;

Inventors:

Haishan Zeng, Vancouver, CA;

Harvey Lui, Singapore, SG;

Zhiwei Huang, Singapore, SG;

David I. McLean, Vancouver, CA;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods and apparatus for classifying tissue use features of Raman spectra and background fluorescent spectra. The spectra may be acquired in the near-infrared wavelengths. Principal component analysis and linear discriminant analysis of reference spectra may be used to obtain a classification function that accepts features of the Raman and background fluorescence spectra for test tissue and yields an indication as to the likelihood that the test tissue is abnormal. The methods and apparatus may be applied to screening for skin cancers or other diseases.


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