The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8326050 B1

PDF
Full Text
Expired
Date of Patent:
Dec. 04, 2012

Filed:

Dec. 02, 2008
Applicants:

Oscar Chi-lim AU, Hong Kong, HK;

LU Fang, Hong Kong, HK;

Hon Wah Wong, Hong Kong, HK;

Yi Yang, Hong Kong, HK;

Yan Huo, Shenzhen, CN;

Inventors:

Oscar Chi-Lim Au, Hong Kong, HK;

Lu Fang, Hong Kong, HK;

Hon Wah Wong, Hong Kong, HK;

Yi Yang, Hong Kong, HK;

Yan Huo, Shenzhen, CN;

Assignee:

Hong Kong Applied Science and Technology Research Institute Company Limited, Hong Kong Science Park, Shatin, New Territories, Hong Kong, CN;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/36 (2006.01);
U.S. Cl.
CPC ...
Abstract

This invention relates to method and apparatus for subpixel-based down-sampling. This invention implements an adaptive filterbased on edge detection, which removes visible color fringing artifacts while efficiently retaining sharpness.


Find Patent Forward Citations

Au, Oscar Chi-Lim. (2012). Method and apparatus for subpixel-based down-sampling (U.S. Patent No. 8326050). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8326050

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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