The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 04, 2012
Filed:
Mar. 29, 2007
Suk-han Lee, Yongin-si, KR;
Jong-moo Choi, Seoul, KR;
Dae-sik Kim, Seoul, KR;
Seung-sub OH, Suwon-si, KR;
Suk-han Lee, Yongin-si, KR;
Jong-moo Choi, Seoul, KR;
Dae-sik Kim, Seoul, KR;
Seung-sub Oh, Suwon-si, KR;
Abstract
Provided is a structural light based three-dimensional depth imaging method and system using signal separation coding and error correction thereof capable of detecting, removing and correcting corresponding errors between a projection apparatus and an image photographing apparatus caused by phenomena such as reflection on an object surface, blurring by a focus, and so on, using geometrical constraints between the projection apparatus and the image photographing apparatus. Here, the projection apparatus projects light, and the image photographing apparatus obtains the light. The depth imaging method includes projecting light from a projection apparatus, obtaining the light using an image photographing apparatus, and measuring a distance or a three-dimensional depth image. Therefore, it is possible to provide a structural light based three-dimensional depth imaging method and system using geometrical conditions capable of precisely obtaining three-dimensional depth information of target environment.