The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 04, 2012

Filed:

Jun. 18, 2008
Applicant:

Keiko Muramatsu, Tokyo, JP;

Inventor:

Keiko Muramatsu, Tokyo, JP;

Assignee:

Nikon Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/62 (2006.01); H04N 5/225 (2006.01);
U.S. Cl.
CPC ...
Abstract

An image recognition device includes a detection unit which is configured to detect a first difference between partial information of at least a part of the first image information and the reference information and to detect a second difference between partial information of at least a part of the second image information and the reference information. A recognition unit is configured to recognize a first area corresponding to the reference image in the first image information. A calculation unit is configured to calculate a determination value based on a reference area in the second image information corresponding to the first area by weighting the second difference. The recognition unit is configured to recognize a second area corresponding to the reference image in the second image information based on at least one of the second difference and the determination value.


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Muramatsu, Keiko. (2012). Image recognition and focus adjustment using weighted image difference information (U.S. Patent No. 8325977). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8325977

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