The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 04, 2012

Filed:

Jul. 30, 2010
Applicants:

Hongjian Shi, Souderton, PA (US);

Arun Singh, North Wales, PA (US);

Ed Marandola, Gwynedd, PA (US);

Uwe Mundry, Landrum, SC (US);

Somchai Kreang-arekul, Nonthaburi, TH;

Inventors:

Hongjian Shi, Souderton, PA (US);

Arun Singh, North Wales, PA (US);

Ed Marandola, Gwynedd, PA (US);

Uwe Mundry, Landrum, SC (US);

Somchai Kreang-arekul, Nonthaburi, TH;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and a system for generating a panoramic x-ray image by obtaining volumetric x-ray image data having a first plurality of slices, segmenting the x-ray image data into a first portion above a vertical threshold and a second portion below the vertical threshold, and separating the second portion into a second plurality of slices. Further, the method and the system include generating a plurality of curves for each slice in the second plurality of slices, generating a master arch for the second plurality of slices, and generating a panoramic image based on the master arch.


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