The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 04, 2012

Filed:

Dec. 15, 2009
Applicants:

Xiquan Cui, Pasadena, CA (US);

Lap Man Lee, Arcadia, CA (US);

Changhuei Yang, Pasadena, CA (US);

Inventors:

Xiquan Cui, Pasadena, CA (US);

Lap Man Lee, Arcadia, CA (US);

Changhuei Yang, Pasadena, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 9/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

Embodiments of the present invention relate to techniques for improving optofluidic microscope (OFM) devices. One technique that may be used employs surface tension at a hydrophobic surface to passively pump the fluid sample through the fluid channel. Another technique uses electrodes to adjust the position of objects in the fluid channel. Another technique computationally adjusts the focal plane of an image wavefront measured using differential interference contrast (DIC) based on Young's interference by back propagating the image wavefront from the detection focal plane to a different focal plane. These techniques can be employed separately or in combination to improve the capabilities of OFM devices.


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