The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 04, 2012
Filed:
Dec. 18, 2009
Michael H. Lee, San Jose, CA (US);
Daihua Zhang, Palo Alto, CA (US);
Omer Gila, Cupertino, CA (US);
William D. Holland, Palo Alto, CA (US);
Michael H. Lee, San Jose, CA (US);
Daihua Zhang, Palo Alto, CA (US);
Omer Gila, Cupertino, CA (US);
William D. Holland, Palo Alto, CA (US);
Hewlett-Packard Development Company, L.P., Houston, TX (US);
Abstract
At least some aspects of the disclosure are directed towards densitometers and methods of determining optical density of printed images upon media. According to one example, an optical density determination apparatus includes a first light source configured to emit a first light beam in a first direction towards a substrate; a second light source configured to emit a second light beam in a second direction towards the substrate, the second direction being different than the first direction; a first sensor configured to sense light of the first light beam reflected from the substrate; a second sensor configured to sense light of the second light beam reflected from the substrate; and wherein the first and second sensors are configured to provide signals indicative of the light sensed by the first and second sensors and which are useable to determine optical density of the substrate.