The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 04, 2012

Filed:

Nov. 04, 2009
Applicants:

Wen-yuh Jywe, Huwei Township, Yunlin County, TW;

Teng-yu Yang, Taichung, TW;

Tung-hui Hsu, Kaohsiung, TW;

Inventors:

Wen-Yuh Jywe, Huwei Township, Yunlin County, TW;

Teng-Yu Yang, Taichung, TW;

Tung-Hui Hsu, Kaohsiung, TW;

Assignee:

National Formosa University, Yunlin County, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

A geometric error measuring device includes a measuring module and at least one (quadrant) photodiode. The measuring module has an emitting deice, which may emit at least one light ray; the photodiode may receive the incident ray. Also, the trajectory of the incident ray is parallel with the direction of measurement. If there is no geometric error, the position of the incident light ray will coincide with the position of the measured light ray. If there is a geometric error, the position of the measured light ray will not coincide with the position of the incident light ray. After the data are processed and calculated, geometric errors in straightness, squareness and rotational angles (pitch, yaw and roll) may be obtained. These geometric errors may then be corrected in the setup of a machine.


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