The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 04, 2012

Filed:

Jun. 04, 2010
Applicants:

Andrew Yanowitz, Ben Lomond, CA (US);

Ting Chen, Sunnyvale, CA (US);

David Daming Kuo, San Jose, CA (US);

Haitao Guo, San Jose, CA (US);

Inventors:

Andrew Yanowitz, Ben Lomond, CA (US);

Ting Chen, Sunnyvale, CA (US);

David Daming Kuo, San Jose, CA (US);

Haitao Guo, San Jose, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/235 (2006.01); H04N 5/228 (2006.01);
U.S. Cl.
CPC ...
Abstract

Systems, methods, and devices for dual processing of raw image data by main image processing and alternative image processing capabilities of an electronic device are provided. According to an embodiment, alternative image processing may analyze a first copy of a frame of raw image data before a second copy of the frame of raw image data is processed by main image processing. Thereafter, the main image processing may process the second copy of the frame of raw image. The main image processing may be calibrated based at least in part on the analysis of the first copy of the frame of raw image data.


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