The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 04, 2012
Filed:
May. 07, 2007
Abraham Karel Riemens, Eersel, NL;
Patrick Fernandes Machado, Barcelos, PT;
Christiaan Varekamp, Eindhoven, NL;
Bart Gerard Bernard Barenbrug, Eindhoven, NL;
Robert-paul Mario Berretty, Eindhovem, NL;
Abraham Karel Riemens, Eersel, NL;
Patrick Fernandes Machado, Barcelos, PT;
Christiaan Varekamp, Eindhoven, NL;
Bart Gerard Bernard Barenbrug, Eindhoven, NL;
Robert-Paul Mario Berretty, Eindhovem, NL;
Koninklijke Philips Electronics N.V., Eindhoven, NL;
Abstract
A method of up-scaling a first structure of samples representing a first property, the first structure having a source resolution, into a second structure of samples representing the first property, the second structure having a target resolution, on basis of a third structure of samples representing a second property, the third structure having the source resolution and on basis of a fourth structure of samples representing the second property, the fourth structure of samples having the target resolution, the method comprising: assigning weight factors to respective first samples of the first structure of samples on basis of differences between respective third samples of the third structure of samples and fourth samples of the fourth structure of samples; and computing the second samples of the second structure of samples on basis of the first samples of the first structure of samples and the respective weight factors.