The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 04, 2012
Filed:
Aug. 31, 2010
William Rudnisky, Los Angeles, CA (US);
Guillermo Jimenez, Lake Forest, CA (US);
James J. Hiroshige, Hawthorne, CA (US);
William Rudnisky, Los Angeles, CA (US);
Guillermo Jimenez, Lake Forest, CA (US);
James J. Hiroshige, Hawthorne, CA (US);
Raytheon Company, Waltham, MA (US);
Abstract
A device and method for wide area surveillance of a geographic region includes identifying a search space associated with a geographic region having a plurality of sub-regions. The search space is divided into a plurality of search cells and observation data is collected for each of the plurality of search cells based on a scan of the geographic region. An event generation rate is calculated for each of the search cells based on the collected observation data. One or more of the sub-regions are identified as a region(s) of interest based on the calculated event generation rates. A coverage pattern is estimated for each of the sub-regions and a desired revisit rate is calculated for the region of interest based on the estimated coverage pattern. The desired revisit rate is then output for scanning the region of interest.