The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 04, 2012
Filed:
Mar. 19, 2010
Shaik Shafi Ahamed, Bangalore, IN;
Srinivasa Rao Dangeti, Razole, IN;
Narasimha Rao Pesala, Bangalore, IN;
Thappeta Peddaiah, Bangalore, IN;
Sreenivasulu Reddy Vedicherla, Bangalore, IN;
Vedagiribabu Subramanyam, Bangalore, IN;
Zhenning Liu, Mississauga, CA;
Shaik Shafi Ahamed, Bangalore, IN;
Srinivasa Rao Dangeti, Razole, IN;
Narasimha Rao Pesala, Bangalore, IN;
Thappeta Peddaiah, Bangalore, IN;
Sreenivasulu Reddy Vedicherla, Bangalore, IN;
Vedagiribabu Subramanyam, Bangalore, IN;
Zhenning Liu, Mississauga, CA;
Honeywell International Inc., Morristown, NJ (US);
Abstract
Hidden or overlapped peaks may occur when using SSTDR technology to determine ware faults. These hidden/overlapped peaks may cause false negative determinations (no fault) when testing a wire for faults. In one method of the present invention, the symmetrical property of the SSTDR wave envelope is used to resolve hidden/overlapped peaks. In another method of the present invention, the calibrated normalized loop back SSTDR wave envelope may be used to resolve hidden/overlapped peaks.