The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 04, 2012

Filed:

Nov. 12, 2008
Applicants:

Philippe Feledziak, Pischelsdorf, AT;

Marcel Urban, Fernitz, AT;

Inventors:

Philippe Feledziak, Pischelsdorf, AT;

Marcel Urban, Fernitz, AT;

Assignee:

Austriamicrosystems AG, Unterpremstaetten, AT;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 7/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a measurement method, a plurality of magnetic field sensors (MS-MS) that are arranged along a circular periphery (CIR) and are each configured to emit a sensor signal (H-H) as a function of a magnetic field intensity is provided. A diametrically magnetized magnetic source (MAG) seated rotatably on the circular periphery (CIR) about an axis of rotation (RA) is further provided. A first set of sensor signals from the magnetic field sensors (MS-MS) is received and a first orientation (AL) of an axis (AX) defined by a reference value transition (RFD) is determined as a function the first set. After a rotation of the magnetic source (MAG) about the axis of rotation (RA), a second set of sensor signals is received and a second orientation (AL) of the axis (AX) is determined as a function of the second set of sensor signals. A position (X, Y) of the axis of rotation (RA) is acquired as a function of the first and the second orientation (AL, AL).


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