The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 04, 2012

Filed:

Jul. 03, 2008
Applicant:

Shigeki Kajihara, Uji, JP;

Inventor:

Shigeki Kajihara, Uji, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); B01D 59/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

An MS analysis is performed for each micro area within a specified mass analysis area on a sample. Based on the data obtained by this analysis, a distribution image of a specified m/z ratio of m/z range is created and displayed on a display screen (S-S). When an operator selects a substance of interest on the displayed image and indicates its m/z (S), one or more micro areas in which the MS spectrum intensity at the specified m/z is equal to or higher than a threshold are extracted, and an MS/MS analysis using the m/z of the substance of interest as the precursor is performed on the extracted micro areas (Sand S). An average MS/MS spectrum is calculated from the MS/MS spectrum data obtained for those micro areas (S), and the substance of interest is identified based on the information relating to the peaks appearing on the average MS/MS spectrum (S).


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