The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 04, 2012
Filed:
Apr. 12, 2012
Masaya Nakatani, Hyogo, JP;
Levent Yobas, Hong Kong, CN;
Julien Reboud, Glasgow, GB;
Panasonic Corporation, Osaka, JP;
Agency for Science Technology and Research, Singapore, SG;
Abstract
A measuring device includes a first substrate; and a second substrate bonded on the first substrate. The second substrate has at least two inflow ports, at least two outflow ports, and an injection port. The two inflow ports, the two outflow ports, and the injection port penetrate the second substrate. The first substrate includes partition wall portions opposing to each other, and forming a first cavity between the partition wall portions, and forming at least two second cavities close against one of the partition wall portions. Each second cavity is provided adjacent to the first cavity. Through holes are provided in the respective partition wall portions to connect the first cavity and the second cavity to each other, and the through holes are adapted to capture an object to-be-tested introduced in the first cavity.