The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 04, 2012
Filed:
Jul. 28, 2009
Applicants:
Kenji Murakami, Ehime, JP;
Masahiro Aga, Ehime, JP;
Hideyuki Kurokawa, Ehime, JP;
Takahiko Tanida, Ehime, JP;
Ryosuke Yamada, Ehime, JP;
Inventors:
Kenji Murakami, Ehime, JP;
Masahiro Aga, Ehime, JP;
Hideyuki Kurokawa, Ehime, JP;
Takahiko Tanida, Ehime, JP;
Ryosuke Yamada, Ehime, JP;
Assignee:
Panasonic Corporation, Osaka, JP;
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/10 (2006.01); G01N 33/52 (2006.01);
U.S. Cl.
CPC ...
Abstract
A liquid sample analysis device includes a holder partholding a test piece, an optical systemthat optically detects a reaction state of a liquid sample and a reagent, and a support memberthat integrally supports the holder partand the optical system. The orientation of the test pieceis changed with respect to the direction of gravitational force by rotating the support member