The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8321845 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 27, 2012

Filed:

Oct. 13, 2006
Applicants:

William G. O'farrell, Markham, CA;

Mariano Consens, Toronto, CA;

John Wen Sheng Liu, Markham, CA;

Inventors:

William G. O'Farrell, Markham, CA;

Mariano Consens, Toronto, CA;

John Wen Sheng Liu, Markham, CA;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

Embodiments of the present invention address deficiencies of the art in respect to XPATH expression debugging and provide a novel and non-obvious method, system and apparatus for an XPATH expression debugging framework. In an embodiment of the invention, an XPATH expression debugging method can include receiving an XPATH input expression, parsing the XPATH input expression to produce a group of sub-expressions, and ordering the sub-expressions in a model for the XPATH input expression. Thereafter, in response to a selection of one of the sub-expressions in the model, a result set can be produced for the sub-expression.


Find Patent Forward Citations

O'Farrell, William. (2012). Extensible markup language (xml) path (xpath) debugging framework (U.S. Patent No. 8321845). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8321845

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