The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 27, 2012

Filed:

Sep. 26, 2008
Applicants:

Nathan Moyal, Mukilteo, WA (US);

Dana Olson, Kirkland, WA (US);

Inventors:

Nathan Moyal, Mukilteo, WA (US);

Dana Olson, Kirkland, WA (US);

Assignee:
Attorney:
Assistant Examiner:
Int. Cl.
CPC ...
G01C 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method for measuring capacitance of a capacitive sensor array is disclosed. Upon measuring the capacitance, position information with respect to the sensor array may be determined. A column, a first row, and a second row of a capacitive sensor array may be selected. The first row and the second row intersect with the column of the capacitive sensor array. A differential capacitance between the first row and the second row may be measured. The differential capacitance may be utilized in determining a location of an object proximate to the capacitive sensor array.


Find Patent Forward Citations

Loading…