The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 27, 2012

Filed:

Nov. 03, 2009
Applicants:

MO Chen, Liverpool, NY (US);

Robert Mumford Gowans, Mexico, NY (US);

Inventors:

Mo Chen, Liverpool, NY (US);

Robert Mumford Gowans, Mexico, NY (US);

Assignee:

JADAK, LLC, North Syracuse, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G05B 15/00 (2006.01); G05B 19/00 (2006.01); G05B 11/01 (2006.01);
U.S. Cl.
CPC ...
Abstract

A machine vision system for controlling the alignment of an arm in a robotic handling system. The machine vision system includes an optical imager aligned to simultaneously capture an image that contains a view of the side of an object, such as a test tube, along with a view of the top of the object provided by a mirror appropriately positioned on the robotic arm. The machine vision system further includes a microcontroller or similar device for interpreting both portions of the image. For example, the microcontroller may be programmed to determine the location of the object in the reflected portion of the image and transpose that information into the location of the object relative to the robotic arm. The microcontroller may also be programmed to decode information positioned on the object by interpreting visual information contained in the other portion of the captured image.


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