The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 27, 2012
Filed:
May. 06, 2010
Kazuyuki Tsukamoto, Minato-ku, JP;
Takao Furuya, Ebina, JP;
Minoru Oshima, Ebina, JP;
Yoshinari Iwaki, Ebina, JP;
Kazuyuki Tsukamoto, Minato-ku, JP;
Takao Furuya, Ebina, JP;
Minoru Oshima, Ebina, JP;
Yoshinari Iwaki, Ebina, JP;
Fuji Xerox Co., Ltd., Tokyo, JP;
Abstract
A length measurement apparatus including: a measurement portion that measures a sheet length based on a rotational amount of a length measurement roll for a first detection period in which first and third sensors detect the sheet, and a sheet length based on a rotational amount of the length measurement roll for a second detection period in which the second sensor and any one of the first and third sensors detect the sheet, the any one of the first and third sensors being disposed at a position opposite to the second sensor via the length measurement roll; and a whole length calculation portion that selects the sheet length nearer to integral multiples of the circumference length of the length measurement roll from the sheet lengths measured for the first and second detection periods, and calculates the whole length of the sheet by using the selected sheet length.