The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 27, 2012

Filed:

Jun. 15, 2010
Applicants:

David William Singer, San Francisco, CA (US);

Courtney Ann Kennedy, Sunnyvale, CA (US);

Inventors:

David William Singer, San Francisco, CA (US);

Courtney Ann Kennedy, Sunnyvale, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A perimeter around a detected object in a frame of image data can be generated in a first coordinate system. The perimeter can be converted from the first coordinate system into a second coordinate system having the same aspect ratio as the first coordinate system. A first metadata entry can include dimensions of image data in the second coordinate system. A second metadata entry can provide a location and dimensions of the converted perimeter in the second coordinate space. Additional metadata can indicate matching objects between frames, position of an object relative to other objects in a frame, a probability that an object is correctly detected, and a total number of objects detected across multiple frames of image data.


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