The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 27, 2012

Filed:

Sep. 30, 2010
Applicants:

Yun Zou, Clifton Park, NY (US);

Carey Shawn Rogers, Brookfield, WI (US);

Christopher David Unger, Brookfield, WI (US);

Mark Alan Frontera, Ballston Lake, NY (US);

Sergio Lemaitre, Whitefish Bay, WI (US);

Inventors:

Yun Zou, Clifton Park, NY (US);

Carey Shawn Rogers, Brookfield, WI (US);

Christopher David Unger, Brookfield, WI (US);

Mark Alan Frontera, Ballston Lake, NY (US);

Sergio Lemaitre, Whitefish Bay, WI (US);

Assignee:

General Electric Company, Niskayuna, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/03 (2006.01); H05G 1/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for operating an electron beam system is presented. Further, an electron beam system, an X-ray tube and a CT system that implement the presented method are also described. The method includes generating an electron beam in an X-ray tube in an imaging system. Additionally, a current configuration corresponding to a particular view of the imaging system is identified. If the identified current configuration is within a determined range, a duty cycle of the electron beam for the particular view of the imaging system is modulated using pulse width modulation. Further, the modulated electron beam is focused towards a target.


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