The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 27, 2012
Filed:
Apr. 01, 2008
Danxun Shen, Beijing, CN;
Hong Wei Kong, Beijing, CN;
Xu Zhao, Beijing, CN;
Agilent Technologies, Inc., Santa Clara, CA (US);
Abstract
A system for measuring inter-carrier interference (ICI) in an OFDM system includes a test symbol generator coupled to a transmitter of the OFDM system to generate an N*N orthogonal matrix having N*N test symbols, and to send the test symbols in a test symbol stream via the transmitter to a receiver of the OFDM system. The N*N test symbols are arranged by the test symbol generator into an N*N orthogonal matrix before being sent to the receiver. The system also includes an ICI measuring module coupled to the receiver to detect the N*N test symbols received in the receiver and to arrange the test symbols as a receiving matrix in the same way as the orthogonal matrix in the transmitter. The ICI measuring module outputs the receiving matrix as an ICI matrix of the OFDM system, wherein an element on the kth row, lth column of the ICI matrix represents interference from the lth sub-carrier on the kth sub-carrier, wherein k≠l.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile