The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 27, 2012
Filed:
Oct. 08, 2009
Christoph Bert, Aschaffenburg, DE;
Elke Rietzel, Weiterstadt, DE;
Alexander Gemmel, Erlangen, DE;
Nami Saito, Darmstadt, DE;
Christoph Bert, Aschaffenburg, DE;
Elke Rietzel, Weiterstadt, DE;
Alexander Gemmel, Erlangen, DE;
Nami Saito, Darmstadt, DE;
Abstract
The invention concerns a device for determining control parameters for an irradiation system by means of which a number of irradiation doses are successively deposited at different target points in a target volume. The device comprises an input device which is designed for detecting a target region and for detecting a movement of the target region, an evaluation device for detecting control parameters for controlling a beam in such a way that with the help of the control parameters a beam is able to follow the movement of the target region and to deposit a defined dose distribution in the target region, wherein the evaluation device is designed in such a way that when detecting the control parameters at least a first selectable control parameter is detected so that the beam is able to follow the movement of the target region merely orthogonally to beam direction, or when detecting the control parameters, at least a first selectable control parameter and a further control parameter representing energy modulation are detected, wherein the determination of the at least first control parameter and the further control parameter is performed by considering motion tracking in beam direction.