The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 27, 2012
Filed:
Sep. 18, 2009
Edmund O. Schweitzer, Iii, Pullman, WA (US);
Veselin Skendzic, Pullman, WA (US);
Gary W. Scheer, Pullman, WA (US);
James R. Kesler, Pullman, WA (US);
Douglas M. Trout, Lewiston, ID (US);
Dhruba P. Das, Coatesville, PA (US);
Edmund O. Schweitzer, III, Pullman, WA (US);
Veselin Skendzic, Pullman, WA (US);
Gary W. Scheer, Pullman, WA (US);
James R. Kesler, Pullman, WA (US);
Douglas M. Trout, Lewiston, ID (US);
Dhruba P. Das, Coatesville, PA (US);
Schweitzer Engineering Laboratories Inc, Pullman, WA (US);
Abstract
An method for automatically testing an arc flash detection system by periodically or continually transmitting electro-optical (EO) radiation through one or more transmission cables electro-optically coupled to respective EO radiation collectors. A test EO signal may pass through the EO radiation collector to be received by an EO sensor. An attenuation of the EO signal may be determined by comparing the intensity of the transmitted EO signal to an intensity of the received EO signal. A self-test failure may be detected if the attenuation exceeds a threshold. EO signals may be transmitted according to a particular pattern (e.g., a coded signal) to allow an arc flash detection system to distinguish the test EO radiation from EO radiation indicative of an arc flash event.