The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 27, 2012

Filed:

Dec. 06, 2002
Applicants:

Hossein Maleki, Lawrenceville, GA (US);

Robert J. Selman, Chicago, IL (US);

Abdelbast Guerfi, Brossard, CA;

Elisabeth Dupuis, McMasterville, CA;

Karim Zaghib, Longueuil, CA;

Inventors:

Hossein Maleki, Lawrenceville, GA (US);

Robert J. Selman, Chicago, IL (US);

Abdelbast Guerfi, Brossard, CA;

Elisabeth Dupuis, McMasterville, CA;

Karim Zaghib, Longueuil, CA;

Assignee:

Hydro-Quebec, Montreal, Quebec, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01M 4/58 (2010.01); H01M 4/13 (2010.01); H01M 4/88 (2006.01); H01B 1/04 (2006.01); C08K 3/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

A composite of particles comprising a high crystallinity carbon and a low crystallinity carbon, wherein the low crystallinity carbon exhibits an average lattice constant d=(002) of 0.350 nm or more and a crystallite size L=(002) in the diffraction of C axis of 25 nm or less, as characterized by wide-angle X ray diffraction measurements, the high crystallinity carbon exhibits an average lattice constant d=(002) of 0.338 nm or less and a crystallinity size L=(002) in the diffraction of C axis of 40 nm or more, as characterized by wide-angle X-ray diffraction measurements, the high crystallinity carbon having at least 50% of its external surface embedded within or surrounded by a matrix of low crystallinity carbon.


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