The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 27, 2012
Filed:
Jun. 16, 2011
Hovig Bayandorian, Berkeley, CA (US);
Yujuan Cheng, Foster City, CA (US);
John Dixon, Moss Beach, CA (US);
Kevin Hester, Belmont, CA (US);
Yanqiao Huang, San Mateo, CA (US);
Paul Lundquist, San Francisco, CA (US);
Joy Roy, San Jose, CA (US);
Stephen Turner, Menlo Park, CA (US);
Peiqian Zhao, Mountain View, CA (US);
Cheng Frank Zhong, Fremont, CA (US);
Hovig Bayandorian, Berkeley, CA (US);
Yujuan Cheng, Foster City, CA (US);
John Dixon, Moss Beach, CA (US);
Kevin Hester, Belmont, CA (US);
Yanqiao Huang, San Mateo, CA (US);
Paul Lundquist, San Francisco, CA (US);
Joy Roy, San Jose, CA (US);
Stephen Turner, Menlo Park, CA (US);
Peiqian Zhao, Mountain View, CA (US);
Cheng Frank Zhong, Fremont, CA (US);
Pacific Biosciences of California, Inc., Menlo Park, CA (US);
Abstract
This invention provides systems for analyzing substrates. Also provided by the invention are improved optical systems for enhanced multiplex illumination, optical systems with compact multi-wavelength illumination architectures, optical systems for enhanced detection of optical signals, and optical systems for reduced autofluorescence background noise.