The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 27, 2012

Filed:

May. 18, 2010
Applicants:

Yasuhiro Yamauchi, Osaka, JP;

Masahiro Sakai, Kyoto, JP;

Yusuke Fukui, Osaka, JP;

Keisuke Okada, Osaka, JP;

Inventors:

Yasuhiro Yamauchi, Osaka, JP;

Masahiro Sakai, Kyoto, JP;

Yusuke Fukui, Osaka, JP;

Keisuke Okada, Osaka, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 9/20 (2006.01); H01J 9/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided is a manufacturing method that allows even a PDP having high-definition cells to exhibit excellent image display performance with reduced power consumption by effectively preventing impurities from adhering to the protective layer. Specifically, in a pre-baking step, a back substrateis baked at a pre-baking temperature. Here, a highest pre-baking temperature is set to be lower than a softening point of a sealing material. The back substrateis superposed on a front substrate. Then, a sealing step is performed in a sealing atmosphere prepared by mixing a predetermined amount of a reducing gas with a non-oxidizing gas. The above enables the impurities attributed to organic components due to a sealing material paste to remain as low molecular components, whereby the impurities are evacuated and removed in an evacuating step performed after the sealing step. This prevents adherence of the impurities to the protective layer


Find Patent Forward Citations

Loading…