The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 27, 2012
Filed:
Apr. 14, 2008
Alan W. Reichow, Beaverton, OR (US);
Ryan C. Coulter, Portland, OR (US);
Alan W. Reichow, Beaverton, OR (US);
Ryan C. Coulter, Portland, OR (US);
Nike, Inc., Beaverton, OR (US);
Abstract
System and methods for testing and/or training a subject's vision and neuro-processing abilities are provided. More specifically, the method may include testing various aspects of the subject's vision and neuro-processing abilities, such as depth perception, anticipation timing, perception speed ability, perception scan ability, etc. By using various tests, an efficient examination may be administered. In accordance with the invention, an individual may be subjected to such a method of testing and/or training at a unitary center capable of presenting such tests to the individual, receiving input from the individual, and processing the received input. Such a unitary test center may further be configurable, so that the tests administered may vary based on the needs of the individual. The received input may then, for example, be used to compute data related to the user's vision and neuro-processing abilities, both overall and for each individual test.