The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 27, 2012
Filed:
Jun. 09, 2011
Anatoly Kotlarsky, Churchville, PA (US);
Xiaoxun Zhu, Marlton, NJ (US);
Michael Veksland, Marlton, NJ (US);
Ka Man AU, Philadelphia, PA (US);
Patrick Giordano, Blackwood, NJ (US);
Weizhen Yan, Clementon, NJ (US);
Jie Ren, Suzhou, CN;
Taylor Smith, Haddon Township, NJ (US);
Michael V. Miraglia, Hamilton, NJ (US);
C. Harry Knowles, Hanover, NH (US);
Sudhin Mandal, Ardmore, PA (US);
Shawn DE Foney, Haddon Heights, NJ (US);
Christopher Allen, Plainsboro, NJ (US);
David M. Wilz, Sr., Sewell, NJ (US);
Anatoly Kotlarsky, Churchville, PA (US);
Xiaoxun Zhu, Marlton, NJ (US);
Michael Veksland, Marlton, NJ (US);
Ka Man Au, Philadelphia, PA (US);
Patrick Giordano, Blackwood, NJ (US);
Weizhen Yan, Clementon, NJ (US);
Jie Ren, Suzhou, CN;
Taylor Smith, Haddon Township, NJ (US);
Michael V. Miraglia, Hamilton, NJ (US);
C. Harry Knowles, Hanover, NH (US);
Sudhin Mandal, Ardmore, PA (US);
Shawn De Foney, Haddon Heights, NJ (US);
Christopher Allen, Plainsboro, NJ (US);
David M. Wilz, Sr., Sewell, NJ (US);
Metrologic Instruments, Inc., Blackwood, NJ (US);
Abstract
A method of unlocking restricted extended classes of features and functionalities embodied within an optical scanning system having an extended programming mode. The method involves providing an optical scanning system supporting baseline classes of features and functionalities, and having an extended feature class programming mode for programming extended classes of features and functionalities, in addition to the baseline classes of features and functionalities. A license key is assigned to the optical scanning system, for unlocking at least one of the extended classes of features and functionalities, and programming the optical scanning system to operate with at least one of the extended classes of feature and functionalities, in addition to the baseline classes of features and functionalities. A license is procured to unlock and use at least one of the extended classes of feature and functionalities, and obtaining said license key assigned to the optical scanning system. The said optical scanning system is caused to operate in the extended feature class programming. While the optical scanning system is operating in the extended feature class programming, the license key is used to unlock at least one of the extended classes of features and functionalities, and program the optical scanning system to operate with at least one of the extended classes of feature and functionalities, in addition to the baseline classes of features and functionalities.