The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 27, 2012
Filed:
Jul. 28, 2010
Jong IL Weon, Seoul, KR;
SI Yong Song, Daejeon, KR;
Jong Bae Lee, Daejeon, KR;
Kil Yeong Choi, Daejeon, KR;
Sung Goo Lee, Daejeon, KR;
Jae Heung Lee, Daejeon, KR;
Jong Il Weon, Seoul, KR;
Si Yong Song, Daejeon, KR;
Jong Bae Lee, Daejeon, KR;
Kil Yeong Choi, Daejeon, KR;
Sung Goo Lee, Daejeon, KR;
Jae Heung Lee, Daejeon, KR;
Korea Research Institute of Chemical Technology, Daejeon, KR;
Abstract
Provided is a method for quantitative evaluation of mar- and scratch-induced surface damage on polymeric and coating materials. The method for quantitative evaluation of scratch-induced damage on polymeric and coating materials includes: preparing a test specimen of polymeric and coating materials; inducing a scratch damage on the surface of the test specimen; representing the scratch damage formed on the test specimen as corresponding color coordinates; and calculating a quantitated scratch damage index from a combination of a load applied to the surface of the test specimen and the color coordinates corresponding to the scratch damage.