The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 20, 2012
Filed:
Oct. 14, 2008
Nozomu Aoyama, Kanagawa-ken, JP;
Toshimichi Arima, Kanagawa-ken, JP;
Kyoichi Ozaki, Tokyo, JP;
Hiroyuki Shingai, Tokyo, JP;
Masaaki Suehiro, Ibaraki-ken, JP;
Nozomu Aoyama, Kanagawa-ken, JP;
Toshimichi Arima, Kanagawa-ken, JP;
Kyoichi Ozaki, Tokyo, JP;
Hiroyuki Shingai, Tokyo, JP;
Masaaki Suehiro, Ibaraki-ken, JP;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method and system for analyzing a problem in a computing environment. Symptom rules that include associated problem information are generated in a symptom catalog. An input file including a stack trace provided in response to detecting the problem is received. Function names included in contiguous lines in the stack trace are identified. In response to a search for the function names in the symptom catalog, the function names found in the search are matched to keywords included in a symptom rule. The computing system retrieves problem information that corresponds to the matched keywords. A report is generated that includes the stack trace and a solution included in the retrieved problem information. The generated report uses a text attribute to emphasize the text of the function names included in the stack trace.