The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 20, 2012
Filed:
Sep. 24, 2007
Yasuo Sakurai, Otawara, JP;
Shigeharu Ohyu, Yaita, JP;
Takuzo Takayama, Otawara, JP;
Mariko Shibata, Yokohama, JP;
Yasuo Sakurai, Otawara, JP;
Shigeharu Ohyu, Yaita, JP;
Takuzo Takayama, Otawara, JP;
Mariko Shibata, Yokohama, JP;
Kabushiki Kaisha Toshiba, Tokyo, JP;
Toshiba Medical Systems Corporation, Otawara-shi, JP;
Abstract
An examination-item database storing a plurality of types of examination items capable of examining a predetermined disease and attributes of these examination items so as to correspond to one another is prepared, the degree of risk for the predetermined disease is calculated based on individual physical information, a criterion for selection of an examination item for examining the predetermined disease is generated in accordance with the calculated degree of risk, and an examination item having an attribute meeting the selection criterion is searched out from the examination-item database. In addition, the calculated degree of risk and the examination-item database are displayed so as to correspond to the predetermined disease. This makes it possible to perform the optimal examination for each individual in accordance with the degree of risk, thereby improving the efficiency of detection of a disease. Moreover, reduction of superfluous examinations makes it possible to reduce physical and psychological burdens imposed on a patient by examinations.