The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 20, 2012

Filed:

Apr. 22, 2002
Applicants:

David Opalsky, San Diego, CA (US);

Ping Yip, San Diego, CA (US);

Kishorchandra Bhakta, San Diego, CA (US);

Inventors:

David Opalsky, San Diego, CA (US);

Ping Yip, San Diego, CA (US);

Kishorchandra Bhakta, San Diego, CA (US);

Assignee:

Sequenom, Inc., San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2011.01); G01N 24/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Systems and methods for testing samples, particularly biological samples are provided. The system includes an instrument for detecting molecules in samples, and a processor that communicates with the instrument to provide results-based control of the instrument to effect assay-based judging. For example, a system, including software, is provided that directs and performs assays such as diagnostic assays that employ a mass spectrometer. The output of the system, rather than a mass spectrum or other raw data form, is the diagnostic outcome, such as a genotype.


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