The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 20, 2012

Filed:

Apr. 06, 2009
Applicants:

Shoichi Kanayama, Otawara, JP;

Omar S. Khalil, Chicago, IL (US);

Tzyy-wen Jeng, Vernon Hills, IL (US);

Shu-jen Yeh, Glencoe, IL (US);

Inventors:

Shoichi Kanayama, Otawara, JP;

Omar S. Khalil, Chicago, IL (US);

Tzyy-Wen Jeng, Vernon Hills, IL (US);

Shu-Jen Yeh, Glencoe, IL (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/1455 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for noninvasive measurement of glucose in a tissue of a subject, including the steps of bringing an adaptation device, which has a shape similar to a measurement probe, into contact with a skin part of a subject for stretching the skin part of the subject under a pressure that is higher than a pressure per unit area applied by the measurement probe during the noninvasive measurement, maintaining the contact for a predetermined period of time followed by relieving the contact, bringing the measurement probe into contact with the stretched skin part of the subject for the noninvasive measurement, collecting signals emitted from the subject, and estimating a glucose concentration based on the collected signals.


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