The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 20, 2012

Filed:

Oct. 22, 2010
Applicants:

Xinhong Ding, Buffalo Grove, IL (US);

Ronald E. Malmin, Chicago, IL (US);

Inventors:

Xinhong Ding, Buffalo Grove, IL (US);

Ronald E. Malmin, Chicago, IL (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for measuring a SPECT collimator's hole orientation angles includes obtaining a set of stepped radiation line images of a line radiation source by scanning/stepping the line radiation source across a first collimator in a first direction; obtaining a second set of stepped radiation line images of the line radiation source across the first collimator in a second direction that is perpendicular to the first direction; and obtaining two sets of stepped radiation line images for a second collimator, wherein one of the two collimators is a reference collimator and the other is a collimator being measured. Calculating the collimator hole orientation angles requires determining offset distances along the two directions for each pair of lines between the reference collimator's line images and the measured collimator's line images by identifying and pairing the lines from the reference collimator line images and the measured collimator line images. The method provides an automated way of identifying and pairing the lines.


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