The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 20, 2012
Filed:
Sep. 16, 2010
Xiaoye Wu, Rexford, NY (US);
Dan Xu, Schenectady, NY (US);
Naveen Chandra, Kenosha, WI (US);
Zhanyu GE, Waukesha, WI (US);
Jiang Hsieh, Brookfield, WI (US);
Daniel David Harrison, Delanson, NY (US);
Mary Sue Kulpins, Brookfield, WI (US);
Xiaoye Wu, Rexford, NY (US);
Dan Xu, Schenectady, NY (US);
Naveen Chandra, Kenosha, WI (US);
Zhanyu Ge, Waukesha, WI (US);
Jiang Hsieh, Brookfield, WI (US);
Daniel David Harrison, Delanson, NY (US);
Mary Sue Kulpins, Brookfield, WI (US);
General Electric Company, Schenectady, NY (US);
Abstract
An imaging system includes an x-ray source that emits a beam of x-rays toward an object, a detector that receives high frequency electromagnetic energy attenuated by the object, a data acquisition system (DAS) operably connected to the detector, and a computer operably connected to the DAS. The computer is programmed to compute detector coefficients based on a static low kVp measurement and a static high kVp measurement, capture incident spectra at high and low kVp during fast kVp switching, compute effective X-ray incident spectra at high and low kVp during fast kVp switching using the captured incident spectra, scan a water phantom and normalize the computed detector coefficients to water, adjust the computed effective X-ray incident spectra based on the normalized detector coefficients, compute basis material decomposition functions using the adjusted X-ray incident spectra, and generate one or more basis material density images using the computed basis material decomposition functions.