The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 20, 2012
Filed:
Mar. 31, 2009
Shayan Zhang, Austin, TX (US);
Troy L. Cooper, Austin, TX (US);
Jack M. Higman, Austin, TX (US);
Prashant U. Kenkare, Austin, TX (US);
Andrew C. Russell, Austin, TX (US);
Shayan Zhang, Austin, TX (US);
Troy L. Cooper, Austin, TX (US);
Jack M. Higman, Austin, TX (US);
Prashant U. Kenkare, Austin, TX (US);
Andrew C. Russell, Austin, TX (US);
Freescale Semiconductor, Inc., Austin, TX (US);
Abstract
A memory and method for access the memory are provided. A first test is used to test memory elements to determine a lowest power supply voltage at which all the memory elements will operate to determine a weak memory element. Redundancy is used to substitute a redundant memory element for the weak memory element. The weak memory element is designated as a test element. In response to receiving a request to change a power supply voltage provided to the memory elements, a second test is used to test the test element to determine if the test element will function correctly at a new power supply voltage. If the test element passes the second test, the memory elements are accessed at the new power supply voltage. If the test element fails the second test, the memory elements are accessed using an access assist operation.