The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 20, 2012

Filed:

Mar. 04, 2009
Applicants:

Xiquan Cui, Pasadena, CA (US);

Xin Heng, Emeryville, CA (US);

Lap Man Lee, Pasadena, CA (US);

Changhuei Yang, Pasadena, CA (US);

Inventors:

Xiquan Cui, Pasadena, CA (US);

Xin Heng, Emeryville, CA (US);

Lap Man Lee, Pasadena, CA (US);

Changhuei Yang, Pasadena, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Embodiments of the present invention relate to techniques for improving optofluidic microscope (OFM) devices. One technique which may be used eliminates the aperture layer covering the light detector layer. Other techniques retain the aperture layer, reversing the relative position of the light source and light detector such that light passes through the aperture layer before passing through the fluid channel to the light detector. Another technique adds an optical tweezer for controlling the movement of objects moving through the fluid channel. Another technique adds an optical fiber bundle to relay light from light transmissive regions to a remote light detector. Another technique adds two electrodes at ends of the fluid channel to generate an electrical field capable of moving objects through the fluid channel while suppressing rotation. These techniques can be employed separately or in combination to improve the capabilities of OFM devices.


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