The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 20, 2012
Filed:
Feb. 10, 2010
Takeshi Yamawaki, Tokyo, JP;
Takeshi Yamawaki, Tokyo, JP;
Canon Kabushiki Kaisha, , JP;
Abstract
An optical scanning apparatus, including an incident system that allows a beam from the light source to enter to deflector; and an imaging system that images the beam deflected by the deflector on a scanning surface, in which the incident system includes a first and second systems, the first system includes first and second elements each having a positive power with rotational symmetry, the light source is positioned at a shorter distance from the front focus position of the first element, the first element is formed integrally as a unit, powers of the second element and the first system, magnifications within main and sub-scanning sections of entire system, and focus movement within the main and sub-scanning sections on the scanning surface when the second element is moved in the optical axis direction are appropriately set.