The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 20, 2012
Filed:
Mar. 28, 2007
Applicant:
Wei LI, Princeton, NJ (US);
Inventor:
Wei Li, Princeton, NJ (US);
Assignee:
Siemens Medical Solutions USA, inc., Malvern, PA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09G 5/00 (2006.01); G06T 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
Mip-map construction is provided for three-dimensional rendering from an anisotropic dataset. One or more mip-map levels are generated by down sampling in the world space rather than texture space. The down sampling may be by an arbitrary scale factor rather than a power of two. For example, the voxels may be down sampled along one dimension by less than half (e.g., 16 to 12). The scale factors may be different along different dimensions. This non-uniform reduction in voxels may result in the mip-map being more isotropic than the anisotropic dataset.