The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 20, 2012
Filed:
Jan. 15, 2009
Aravind Krishnaswamy, San Jose, CA (US);
Gavin S. P. Miller, Los Altos, CA (US);
Aravind Krishnaswamy, San Jose, CA (US);
Gavin S. P. Miller, Los Altos, CA (US);
Adobe Systems Incorporated, San Jose, CA (US);
Abstract
Method and apparatus that employs one or more perceptual metrics in determining a priori a number of samples to take at each location during irradiance computation. A number of hemisphere samples to be taken at each location in a scene may be calculated according to one or more perceptual metrics corresponding to the location. Perceptual metrics that may be used may include one or more of, but are not limited to: the overall direct lighting at the location; the diffuse texture of the surface at or around the location; and the color at the location. An irradiance value for each location may be calculated according to the number of samples calculated for the location. This perceptual metrics technique for determining a priori the number of samples needed is orthogonal to conventional adaptive sampling techniques, and can be adapted for use in other irradiance computation techniques.