The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 20, 2012
Filed:
Oct. 30, 2009
Kuo-chiang Nien, Hsinchu, TW;
Li-cheng Shen, Hsinchu, TW;
Chin-lien Hsu, Hsinchu, TW;
Tsung-ying Hsieh, Hsinchu, TW;
Kuo-Chiang Nien, Hsinchu, TW;
Li-Cheng Shen, Hsinchu, TW;
Chin-Lien Hsu, Hsinchu, TW;
Tsung-Ying Hsieh, Hsinchu, TW;
Quanta Computer, Inc., Kuei Shan Hsiang, Tao Yuan Shien, TW;
Abstract
The invention discloses a testing system and a testing method. The testing system includes a testing platform and a fetching device. The testing platform includes a metal base plate, a DUT board, a testing stand and a metal wall. The DUT board is disposed on the metal base plate. The testing stand is disposed on the DUT board. The metal wall is disposed on the metal base plate and surrounds the testing stand. The fetching device is movably disposed above the testing platform and used for placing a DUT on the testing stand. A metal covering plate of the fetching device corresponds to the metal wall of the testing platform. When the fetching device places the DUT on the testing stand, the metal covering plate cooperates with the metal wall and the metal base plate of the testing platform to form an isolated space, so as to isolate the DUT.