The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 20, 2012

Filed:

Mar. 26, 2010
Applicants:

Oliver Bieri, Liestal, CH;

Klaus Scheffler, Basel, CH;

Inventors:

Oliver Bieri, Liestal, CH;

Klaus Scheffler, Basel, CH;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Apparatus and methods for quantification of transverse relaxation times (T) using steady-state free precession sequences (generally known as fast imaging sequences) and their sensitivity to a quadratic increase of the RF pulse phase, also known as RF spoiling. Using at least two image acquisitions with different partial RF spoiling increments, Tcan be assessed with high precision and with short acquisition times in the limit of large excitation angles being independent on the longitudinal relaxation time (T) and magnetization transfer effects as compared to other SSFP based quantitative Tmethods. This invention is not restricted to any kind of target and may be applied in 3D as well as in 2D.


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